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Sunny Optical Public Test Platform

Quick, Reliable, Fairness

Core Advantages

Authoritative Certification

The laboratory is CNAS-accredited and has reliable, professional laboratory management.

Multi-category Testing Capabilities

Comprehensive testing types more than 50 test items of various categories can be carried out.

Professional Equipment

Equipped with high-precision testing equipment.
There are more than 140 large-scale instruments and equipment.

Professional Team

Equipped with an experienced professional team to provide high-quality services.

Quality Assurance

Recognized by multiple well-known major automotive OEMs.

Laboratory Introduction

Sunny Optical Test Laboratory

The laboratory was jointly established by Zhejiang Intelligent Optical Perception Innovation Center and Sunny Optical Technology Co., Ltd. It is a comprehensive laboratory with reliability testing, electromagnetic compatibility testing, material testing and failure analysis as its core.

Adhering to the principles of fairness and justice, precision and reliability, and rapid response, the laboratory continuously explores innovative pathways for development. While serving internal clients, it is also committed to establishing a robust testing support platform for upstream and downstream industries, as well as the integrated optoelectronic ecosystem.
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CNAS Certification

The laboratory holds CNAS (China National Accreditation Service for Conformity Assessment) accreditation and maintains a professional and reliable laboratory management system. Between 2019 and 2024, it successfully obtained laboratory accreditations from several leading automotive manufacturers, including Li Auto, NIO, Xiaomi, and Seres. With a vision to promote industrialization through informatization, the laboratory is committed to supporting industrial transformation and upgrading.

Available Test Items

Environmental Reliability TestEMC TestMaterial TestFailure Analysis
Salt Spray Test

Radiated Emissions of Components/Modules – ALSE Method

TMA (Thermomechanical Analyzer)Nondestructive Testing CT
Low Temperature TestConducted Emissions from Components/Modules – Voltage MethodRefractive Index and Refractive Index Dn/DtMicroscopic Morphology Measurement and Analysis SEM
High Temperature TestConducted Emissions From Components/Modules – Current Probe Method Component Analysis EDS
Constant Temperature
Radiated Interference Immunity – Anechoic Chamber Method Focused Ion Beam Cutting FIB
Humidity Test
Damp Heat Cycling Test
Electrostatic Discharge Immunity  
Temperature/Humidity Combined Cycle TestPower Line Transient Conduction Interference Immunity  
Temperature ChangesBulk Current Injection (BCI)  
Vibration (Sinusoidal)Portable Handheld Transmitter Anti-interference  
Broadband Random Vibration TestSignal Line Coupling Anti-interference  
Drop TestLow Frequency Magnetic Field Emission  
Temperature Cycle and Sinusoidal Vibration
Random Vibration Comprehensive Test		DC Voltage Operating Range  
Comprehensive Tests of Climate (Temperature, Humidity) and Dynamics (Vibration, Shock)Overvoltage  
ShockSuperimposed AC  
Solar Radiation Test
Supply Voltage Ramp Down and Ramp Up
  
Dust TestThe Supply Voltage Drops Momentarily  
 Withstand Voltage Insulation Resistance Tester  
 Reset Characteristics  
 Startup Features  
 Load Dump  
 Reverse Voltage  
 Open Circuit  
 Short Circuit Protection  

Contact Details

  • Tel:0574-62530919
  • Email：syts@sunnyoptical.com
  • Address：Laboratory Buliding, 67-69 Fengle Road, Yuyao, Zhejiang, China

Contact Information

0571-81181281

Working Day：9:00-18:00

Company Email

sunnyresearch@sunnyoptical.com

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about

Reliability Test

The laboratory covers an area of ​​over 1,200 square meters and is equipped with more than 60 large scientific research equipment. It can provide more than 10 reliability tests and undertake reliability testing business for optomechanical components, automotive electronics and other products, covering the entire product life cycle from R&D samples, small batches to mass production. At present, there are sample rooms, environmental laboratories, mechanical laboratories, salt spray laboratories, lighting laboratories, dust laboratories, etc., dedicated to creating a complete experimental platform for reliability testing of hardware products in the entire industry.

Ambient temperature
reliability test system

Use various environmental testing equipment to simulate stresses such as temperature, humidity and temperature changes under climatic conditions, accelerate the reaction of products in actual use environments, verify whether they meet the expected quality goals in R&D, design and manufacturing, and evaluate the product as a whole to determine its reliability life. Product reliability tests can be carried out under conditions such as low temperature, high temperature, constant humidity and heat, alternating humidity and heat, and temperature changes.

High and low temperature impact test chamber

TSG5055WS
Temperature: -55℃～150℃
Conversion time: ≤10s

High and low temperature humidity test chamber

EL-04KA
Temperature：-40℃～150℃
Humidity：25%RH～98%RH

Rapid temperature change test chamber

EC-25EXHH
Temperature：-70℃～150℃
Humidity：20%RH～98%RH
Speed：20℃/min（-48℃ ～ 128 ℃ ）

Mechanical testing system

Use various equipment to simulate the mechanical stress that a product may encounter during transportation, handling, and use to evaluate its durability, stability, reliability, and safety. This process helps designers understand the mechanical stress that a product may face in actual use, thereby evaluating its ability to work properly and maintain functionality. Tests such as free fall, package drop, mechanical shock, collision, sinusoidal vibration, and random vibration can be performed.

Three comprehensive test chambers

CW0670WS
Temperature adjustment range：-70℃～150℃
Humidity adjustment range：20%～98%RH
Temperature fluctuation：≤±0.5℃
Temperature uniformity：≤±2℃

Vibration test bench

DC-3200-36
Frequency range：5-2500hz
Maximum displacement：51mm

Drop test machine

DLJ-50
Drop height： 300～1800mm
Maximum package weight： 50kg

Mechanical shock table

CL-10
Shock pulse peak acceleration：30-1500g
Duration：11～0.5ms

Salt spray test system

It is mainly used to evaluate the salt spray corrosion resistance of products or metal materials. The results of salt spray test directly reflect the quality of the product. The accuracy and rationality of the judgment results are the key to measuring the salt spray corrosion resistance of products or metals.

Alternating salt spray test chamber

YWX-750
Test chamber temperature range：35℃～65℃
Test method: fixed value, program optional
Volume (test area)：W1100×H500×D750mm

about

Electromagnetic compatibility testing

The electromagnetic compatibility (EMC) laboratory includes a 3-meter semi-anechoic chamber, a shielded room, a transient immunity room, and an electrostatic discharge room. The supporting test instruments are manufactured by well-known international companies in the industry, such as Germany’s Rohde&Schwarz, Schwarzbeck, TESEO, HILO, and the United States FCC.

We adhere to the principle of “scientific methods and accurate data” to provide electromagnetic compatibility (EMC) testing services for automotive electronic components and consumer electronics, in compliance with international, national, and leading OEM standards.

Electromagnetic Interference Test System

In a semi-anechoic chamber environment, the test system is composed of a measuring receiver and antennas of different frequency bands to monitor the electromagnetic interference generated by the sample itself, Mainly includes radiated emissions as well as conducted emissions on power and signal lines.

Measuring receiver

Radiated emission： 150KHz-6GHz
Conducted emission voltage method： 0.15MHz-108Mhz
Conducted emission current method： 0.15MHz-250MHz

Electromagnetic susceptibility
test system

The sample’s resistance to various types of interference is verified by simulating the emission of electromagnetic waves, magnetic fields, and other disturbance signals across different frequency bands.
Core equipment

Power amplifier, signal generator
power meter, antennas of different frequency bands, field strength probe

Radiated anti-interference
Frequency range： 80MHz~6GHz
Test level： Continuous wave up to 200V/m, radar wave up to 300V/m
Handheld launch
Frequency range: 142MHz~174MHz, 360MHz-6GHz
Test power: Maximum 20W

Material Testing

Optical materials
Refractive index test system

It is mainly used to measure the refractive index of optical glass and crystal materials. The refractive index measurement refers to the ratio of the speed of light in the air to the speed of light in the material. The higher the refractive index of the material, the stronger its ability to refract the incident light. It can measure the refractive index of various optical materials at room temperature using the minimum deflection angle method, and measure the refractive index at high and low temperatures (range -40℃~200℃) using the vertical incidence method.

High Precision Refractive Index Measuring Instrument

Measuring range： 195nm-12µm
Measuring accuracy： VIS/NIR： ±2x10^-6
Angular accuracy： ± 0.1”

Measurement repeatability：

UV：±3x10^-6
VIS/NIR：±1x10^-6
SWIR：±5x10^-6
MWIR、LWIR：±1x10^-4

High and low temperature measurement repeatability：

UV：±5x10^-5
VIS/NIR：±5x10^-5
SWIR：±5x10^-5
MWIR、LWIR：±5x10^-4

Material thermal properties
Measurement system

Used to measure the dimensional changes of materials under static loads as the temperature changes. Thermal expansion and thermal effects such as softening, crystallization and solid-solid transformation can reflect the potential changes of materials. Viscoelastic behavior of materials can also be studied by changing the forces acting on the materials. It can measure linear expansion and softening temperature, glass transition temperature of various materials; shrinkage and expansion of thin films; gel time, etc.

Thermomechanical Analyzer (TMA)

TMA/SDTA2+
Manufacturer：
Mettler-Toledo (Switzerland)
Manufacturer：
Mettler-Toledo (Switzerland)
Model： TMA/SDTA2+
Measurement temperature range： -90~600℃
Force range： -0.1...1.0N
Sample measurement range：±5mm
Maximum sample length：20mm
Sample effective test length：小于10mm
DLTMA frequency：0.01~1Hz

Failure Analysis

Microscopic morphology measurement and
composition analysis system

System function introduction and application background: With advanced focused ion beam and electron beam and high-performance X-ray energy spectrometer, using the principle of secondary electron imaging, it is possible to observe the surface microstructure, particle size, cross-sectional thickness, crystal structure, and crystal interface of samples at the micrometer and nanometer scales. The ion beam can achieve fast, high-quality, and fixed-point sample preparation, and the energy spectrometer can be used to measure the type and content of elements on the sample surface. It is mainly used in the fields of nanoscience and nanomaterials, energy materials, engineering materials, bionic materials, semiconductor device design and failure analysis, and life sciences, and has important applications in nanotechnology, materials science, and engineering.

FIB - Focused Ion Beam

Under the action of electric and magnetic fields, the ion beam is focused to the submicron or even nanometer level. The scanning motion of the ion beam is controlled by the deflection and acceleration system to realize the monitoring and analysis of micro-nano graphics and the maskless processing of micro-nano structures.

Accelerating voltage：500V ~ 30KV
Current range：1.5 pA – 65 nA
Spatial resolution: 3.0 nm at 30kV using the selected angle method

SEM - Scanning Electron Microscope

A large precision instrument used for high-resolution micro-area morphology analysis, it has the characteristics of large depth of field, high resolution, intuitive imaging, strong three-dimensional sense, wide magnification range, and the ability to rotate and tilt the sample to be tested in three-dimensional space.

Electron beam performance
Spatial resolution: 0.7nm@30 keV; 1.4nm@1 keV (deceleration mode)
Current range：1pA ~ 400nA
Magnification：40~1，000,000X
voltage：200V ~ 30KV
Stage and Sample
XY range: 110 mm; Z range: 65 mm
Tilt range：-15°~ +90°
Maximum sample size：110 mm
EDS-Energy Spectrometer Performance
Resolution：133eV(Mn Ka)
Analyzed elements：Be（4）-- U（92）

Non-destructive tomography system

Using X-ray tomography, we can detect, reconstruct, present 3D shapes, and inspect the internal structures of small and medium-sized parts. It is mainly used for semiconductors, material integrated products, molds, small medical devices, etc.

YXLON FF35

The YXLON FF35 is a high-resolution metrological CT system for small and medium-sized component inspection. It can be used in a single or dual-tube configuration and is suitable for measuring and analyzing medium to

microscale components in industries such as automotive, electronics, aerospace, and materials science.
Maximum voltage: 225KV (single source, upgradeable to dual source)
Maximum power：320W
Spatial resolution：≥4um
Detector size：150um
Detector area：432 mm × 432 mm
Grayscale level：65536 (16-bit detector)
Sample space movement range: 0 – 575 mm